Premium accounts now available! Sign up and create a premium account. Read more Close

Your cookie settings

This site uses cookies. Some cookies are essential to make the site work and others help us to improve our services. Read more about cookies in our Privacy policy.

Choose your cookie preferences:

Advertisement

Image

V2O5 Surface Electronic Structure Suppresses Ethane Over‐Oxidation, Enabling 65% Ethylene Yield

Journal content Created on 21 Jun 2026 Angewandte Chemie Int Ed

Hongjuan Tao, Yan Chen, Suting He, Benchi Chen, Zhibo Shang, Zilin Ma, Xueming Liu, Liyuan Chai, Zhang Lin

Advertisement

Stats

  • Recommendations n/a n/a positive of 0 vote(s)
  • Views 6
  • Comments 0

Recommended by

  • No recommendations yet.

Do you recommend this? Please sign in. Yes No

Recommended

Post a comment

You need to be signed in to post comments. You can sign in here.

Comments

There are no comments yet.

Advertisement