Septoria nodorum blotch (SNB) and tan spot (TS) wheat diseases are caused by necrotrophic fungal pathogens Parastagonospora nodorum (Pn) and Pyrenophora tritici-repentis (Ptr), respectively. Although recognised as premier model pathosystems for our understanding of necrotrophic effectors, no resistance mechanism has been reported in both diseases. Here, two SNB and TS resistance wheat lines (56:ZWB11 and 105:ZIF14) derived from the Australian national germplasm evaluation programme (CAIGE) were used to develop a double haploid mapping population. Two Pn and Ptr isolates of different pathotypes, their respective culture filtrates and effector SnTox267 were evaluated on the population. Genetic analysis of Ptr conidial inoculation of race 1 and race 2 identified a major resistance quantitative trait locus (QTL) (QTs.cur_1B) on chromosome 1B, while resistance to SNB was explained by several minor QTL. SnTox267 sensitivity was mapped to six locations (2A2, 2A3, 2B1, 2D3, 5B and 7B1) with only one QTL co-localized to known corresponding gene Snn7. Sensitivity loci 5B and 7B1 also conferred SNB resistance at seedling and adult stages. Two QTL on chromosome 2D1 and 7B2 were common in both SNB and TS, associated with disease at seedling stage and culture filtrate bioactivity, respectively. Resistance responses of 56:ZWB11 and 105:ZIF14 were confirmed cytologically, however, distinct responses were observed on wounded leaves. The defence responses were more effective against Ptr, while resistance to Pn infection was likely a combination of lack of susceptibility and effective physical barriers. Overall results demonstrated the distinction between the underlying resistance mechanisms to TS and SNB.
Phan, H. T. T., Furuki, E., Kamphuis, F., Rybak, K., Lenzo, L. V., Cupitt, C. F., Marathamuthu, K., See, P. T.
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